Scanning Probe Microscopy

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical .,characterization .,at the nanoscale. .,This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, .,failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying .,the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

 .,

Academic and industrial scientists and engineers from diverse disciplines such as physics, chemistry, biology, engineering, materials science, .,and biotechnology who use or would like to use scanning probe methods in research and development. The chapters will also be a value to advanced undergraduate and graduate students in these fields.